Comment on the Dependence of R□and Current Noise on Grain Size in Thick Film Resistors (TFR's) | Zendy

Manfred Wolf | Zendy; Franz Müller | Zendy; H. Hemschik | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Comment on the Dependence of R_□and Current Noise on Grain Size in Thick Film Resistors (TFR's)

Author(s) -

Manfred Wolf,

Franz Müller,

H. Hemschik

Publication year - 1984

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/1985/68618

Subject(s) - resistor , electrical resistivity and conductivity , grain size , noise (video) , current (fluid) , condensed matter physics , thermal conduction , volume fraction , component (thermodynamics) , metal , volume (thermodynamics) , materials science , electrical engineering , physics , thermodynamics , composite material , metallurgy , engineering , computer science , voltage , image (mathematics) , artificial intelligence

The heterogeneous structure of TFR's results in high resistivities and high current noise. Accepting models of conduction in TFR's, according to which the resistivity is determined by a resistance independent of bulk-resistivity of a metallic-like component, it will be shown, that R□ and Ceff*(describing current noise behaviour) increase with d and d3, respectively, when d is the grain size. On the other hand, both quantities depend on the volume fraction of the metallic component in the same manner. This leads to the conclusion, that a general dependence in the form Ceff*= f(R□) cannot exist.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research