Voltage Degradation Model of Thin Film Capacitors | Zendy

T.M. Berlicki | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Voltage Degradation Model of Thin Film Capacitors

Author(s) -

T.M. Berlicki

Publication year - 1984

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.144

H-Index - 22

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/1985/26014

Subject(s) - capacitor , degradation (telecommunications) , voltage , materials science , thin film , film capacitor , function (biology) , electrical engineering , composite material , optoelectronics , engineering , nanotechnology , evolutionary biology , biology

A degradation model of thin film capacitors is presented. This model takes into consideration that:(a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is afunction of working voltage. On the base of this model, the short term breakdown voltage and itsdistribution is defined. The experimental data presented conforms with the described model

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research