Open AccessThe Generation Rate Analysis of Different S/D Junction Engineering in Scaled UTBOX 1T-DRAM
Author(s) -
Talitha Nicoletti,
K. R. A. Sasaki,
S. D. dos Santos,
J. A. Martino,
M. Aoulaiche,
Eddy Simoen,
Cor Claeys
Publication year - 2013
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2013-01/21/893
Subject(s) - dram , optoelectronics , materials science , electrical engineering , computer science , reliability engineering , engineering
not Available.
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