Open AccessHigh Resolution Characterization of Pitting Corrosion Using a Novel Environmental SVET and White Light Interferometry
Author(s) -
Steven Geary,
H. N. McMurray,
A.C.A. de Vooys
Publication year - 2012
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2012-02/23/2283
Subject(s) - interferometry , characterization (materials science) , white light , materials science , corrosion , pitting corrosion , white light interferometry , optics , metallurgy , nanotechnology , optoelectronics , physics
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