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Study of Crack Propagation on Single Crystalline Silicon Wafer during Electrochemical Lithiation and Delithiation
Author(s) -
Chan Soon Kang,
SeoungBum Son,
Seul Cham Kim,
Se-Hee Lee,
KyuHwan Oh
Publication year - 2012
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2012-01/9/516
Subject(s) - wafer , materials science , electrochemistry , silicon , crystalline silicon , metallurgy , composite material , nanotechnology , engineering physics , forensic engineering , optoelectronics , chemistry , engineering , electrode

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