Open AccessInvestigating the Degradation Behavior Under Hot Carrier Stress for InGaZnO TFT with Symmetric and Asymmetric Structure
Author(s) -
Ming-Yen Tsai,
TingChang Chang,
AnnKuo Chu,
Te-Chih Chen,
TienYu Hsieh,
Yu-Te Chen
Publication year - 2012
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2012-01/22/926
Subject(s) - degradation (telecommunications) , stress (linguistics) , thin film transistor , materials science , computer science , composite material , telecommunications , philosophy , linguistics , layer (electronics)
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