z-logo
open-access-imgOpen Access
On-Current Variability Sources of FinFETs: Analysis and Perspective for 14nm-Lg Technology
Author(s) -
Takashi Matsukawa,
Yongxun Liu,
Kazuhiko Endo,
S. O’uchi,
Meishoku Masahara
Publication year - 2012
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2012-01/20/879
Subject(s) - perspective (graphical) , current (fluid) , engineering physics , materials science , engineering , electrical engineering , computer science , artificial intelligence

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom