Open AccessInvestigation on Hot Carrier Degradation on TixN1-x/HfO2 MOSFETs
Author(s) -
Jyun-Yu Tsai,
TingChang Chang,
Wen-Hung Lo,
Chih-Hao Dai,
Ching-En Chen,
Hua-Mao Chen,
Jian-ming Hung,
Osbert Cheng,
Cheng Tung Huang
Publication year - 2012
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2012-01/16/710
Subject(s) - degradation (telecommunications) , materials science , engineering physics , optoelectronics , environmental science , electronic engineering , engineering
not Available.
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