Open AccessCatalyst Layer Analysis: Nanoscale X-ray CT, Spatially-Resolved In Situ Microscale Diagnostics, and Modeling
Author(s) -
Shawn Litster,
Katherine C. Hess,
William K. Epting,
Jeff Gelb
Publication year - 2011
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2011-02/16/822
Subject(s) - microscale chemistry , nanoscopic scale , in situ , materials science , layer (electronics) , nanotechnology , physics , meteorology , mathematics education , mathematics
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