z-logo
open-access-imgOpen Access
High Power Density UV Optical Stress for Quality Evaluation of 4H-SiC Epitaxial Layers
Author(s) -
Andrea Canino,
Massimo Camarda,
Francesco La Via
Publication year - 2011
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2011-01/24/1478
Subject(s) - epitaxy , materials science , optoelectronics , stress (linguistics) , power (physics) , power density , quality (philosophy) , engineering physics , composite material , physics , layer (electronics) , linguistics , philosophy , quantum mechanics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom