Open AccessInvestigation of Electron and Hole Charge Trapping in LaLuO3 Stack MOS Capacitor Using the 3-Pulse CV Technique
Author(s) -
Naser Sedghi,
Ivona Z. Mitrović,
J. M. J. Lopes,
J. Schubert,
S. Hall
Publication year - 2011
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2011-01/22/1393
Subject(s) - stack (abstract data type) , trapping , capacitor , charge (physics) , materials science , electron , pulse (music) , optoelectronics , atomic physics , electrical engineering , physics , voltage , computer science , nuclear physics , engineering , quantum mechanics , programming language , ecology , biology
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