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GaN Reliability Through the Decade
Author(s) -
Kurt V. Smith
Publication year - 2009
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2009-01/21/883
Subject(s) - reliability (semiconductor) , reliability engineering , materials science , computer science , psychology , environmental science , engineering physics , engineering , physics , thermodynamics , power (physics)
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