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Comparison of ZnO Dry Etching in High Density Inductively Coupled CH4/H2 and C2H6/H2-based Chemistries
Author(s) -
Wantae Lim,
S. J. Pearton,
Lars F. Voss,
Rohit Khanna,
Jonathan O. Wright,
F. Ren,
D. P. Norton
Publication year - 2006
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2006-01/11/503
Subject(s) - inductively coupled plasma , dry etching , etching (microfabrication) , inductively coupled plasma atomic emission spectroscopy , chemistry , analytical chemistry (journal) , materials science , environmental chemistry , nanotechnology , plasma , physics , layer (electronics) , quantum mechanics
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