Comparative Investigation of Polarization Mechanism of Sputter Deposited Cermet Cathode Interlayers by Impedance-Spectra Time Relaxation Transform Technique
Author(s) -
Nikolay Khramushin
Publication year - 2003
Publication title -
ecs proceedings volumes
Language(s) - English
Resource type - Journals
eISSN - 2576-1579
pISSN - 0161-6374
DOI - 10.1149/200307.0632pv
Subject(s) - cathode , cermet , polarization (electrochemistry) , yttria stabilized zirconia , materials science , analytical chemistry (journal) , sputter deposition , dielectric spectroscopy , cavity magnetron , sputtering , electrochemistry , thin film , chemistry , electrode , composite material , cubic zirconia , nanotechnology , ceramic , chromatography
The influence of the structure of ultra-dispersed YSZ+Pt cermet layers on polarization resistance of SOFC cathode was investigated. The cermet layers were deposited by reactive magnetron sputtering with inclined or direct beams to the YSZ surface. The polarization resistance was determined from the impedance spectra of the electrochemical cell. There is a unique transform of imaginary part of impedance frequency distribution to time relaxation distribution of the polarization resistance. The transformation method is described. The data obtained were interpreted in terms of the cathode reaction microkinetic model. The time relaxation spectra peaks near 10 -1 s and 10 -3 s were attributed to oxygen adsorption and oxygen ion diffusion, respectively. The influence of deposition and heating conditions, and cathode electrical bias on the time relaxation spectra were considered. The results were compared with morphology features of samples under investigations.
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