Analysis of the Cathode Electrical Contact in SOFC Stacks | Zendy

David Kennouche | Zendy; Qingping Fang | Zendy; L. Blum | Zendy; Detlef Stolten | Zendy

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Analysis of the Cathode Electrical Contact in SOFC Stacks

Author(s) -

David Kennouche,

Qingping Fang,

L. Blum,

Detlef Stolten

Publication year - 2018

Publication title -

journal of the electrochemical society

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.258

H-Index - 271

eISSN - 1945-7111

pISSN - 0013-4651

DOI - 10.1149/2.0761809jes

Subject(s) - cathode , ohmic contact , stack (abstract data type) , dielectric spectroscopy , contact resistance , materials science , electrical impedance , degradation (telecommunications) , relaxation (psychology) , solid oxide fuel cell , electrical contacts , oxide , layer (electronics) , electrochemistry , analytical chemistry (journal) , composite material , electrode , forensic engineering , chemistry , electronic engineering , electrical engineering , metallurgy , anode , computer science , psychology , social psychology , chromatography , programming language , engineering

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