z-logo
open-access-imgOpen Access
Implementation of a 900 V Switching Circuit for High Breakdown Voltage β-Ga2O3 Schottky Diodes
Author(s) -
YenTing Chen,
Jiancheng Yang,
F. Ren,
Chin-Wei Chang,
Jenshan Lin,
S. J. Pearton,
Marko J. Tadjer,
Akito Kuramata,
YuTe Liao
Publication year - 2019
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2.0421907jss
Subject(s) - schottky diode , materials science , optoelectronics , breakdown voltage , diode , schottky barrier , substrate (aquarium) , metal–semiconductor junction , epitaxy , voltage , fabrication , layer (electronics) , electrical engineering , nanotechnology , engineering , medicine , oceanography , alternative medicine , pathology , geology
1Department of Electrical and Computer Engineering, National Chiao Tung University, Hsinchu, Taiwan 2Department of Chemical Engineering, University of Florida, Gainesville, Florida 32611, USA 3Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida 32611, USA 4Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611, USA 5U.S. Naval Research Laboratory, Washington, DC 20375, USA 6Tamura Corporation and Novel Crystal Technology, Inc., Saitama 350-1328, Japan

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom