Thermally Driven SOFC Degradation in 4D: Part I. Microscale | Zendy

Thomas M. M. Heenan | Zendy; Xuekun Lu | Zendy; Francesco Iacoviello | Zendy; James B. Robinson | Zendy; Dan J. L. Brett | Zendy; Paul R. Shearing | Zendy

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Thermally Driven SOFC Degradation in 4D: Part I. Microscale

Author(s) -

Thomas M. M. Heenan,

Xuekun Lu,

Francesco Iacoviello,

James B. Robinson,

Dan J. L. Brett,

Paul R. Shearing

Publication year - 2018

Publication title -

journal of the electrochemical society

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.258

H-Index - 271

eISSN - 1945-7111

pISSN - 0013-4651

DOI - 10.1149/2.0151811jes

Subject(s) - materials science , sintering , microscale chemistry , delamination (geology) , temperature cycling , anode , particle (ecology) , composite material , dwell time , degradation (telecommunications) , thermal barrier coating , oxide , solid oxide fuel cell , thermal , metallurgy , ceramic , chemistry , thermodynamics , electrical engineering , engineering , mathematics education , mathematics , subduction , oceanography , biology , tectonics , paleontology , medicine , clinical psychology , physics , electrode , geology

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