Open AccessInsight on the Characterization of MoS2Based Devices and Requirements for Logic Device Integration
Author(s) -
César J. Lockhart de la Rosa,
Goutham Arutchelvan,
Iuliana Radu,
Dennis Lin,
Cedric Huyghebaert,
Marc Heyns,
Stefan De Gendt
Publication year - 2016
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2.0131611jss
Subject(s) - materials science , characterization (materials science) , transistor , subthreshold conduction , measure (data warehouse) , electronic engineering , semiconductor , contact resistance , semiconductor device , computer science , optoelectronics , nanotechnology , electrical engineering , voltage , data mining , engineering , layer (electronics)
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