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Wet-Chemical Approaches for Atomic Layer Etching of Semiconductors: Surface Chemistry, Oxide Removal and Reoxidation of InAs (100)
Author(s) -
Dennis H. van Dorp,
Sophia Arnauts,
Frank Holsteyns,
Stefan De Gendt
Publication year - 2015
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2.0081506jss
Subject(s) - etching (microfabrication) , dissolution , isotropic etching , oxide , materials science , layer (electronics) , reactive ion etching , dry etching , analytical chemistry (journal) , inductively coupled plasma , semiconductor , chemical reaction , chemical engineering , inorganic chemistry , nanotechnology , chemistry , optoelectronics , plasma , metallurgy , environmental chemistry , organic chemistry , physics , engineering , quantum mechanics

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