Open AccessThermally Driven SOFC Degradation in 4D: Part II. Macroscale
Author(s) -
Thomas M. M. Heenan,
Xuekun Lu,
James B. Robinson,
Francesco Iacoviello,
Dan J. L. Brett,
Paul R. Shearing
Publication year - 2018
Publication title -
journal of the electrochemical society
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/2.0061811jes
Subject(s) - materials science , temperature cycling , anode , delamination (geology) , cracking , electrolyte , microscale chemistry , composite material , thermal expansion , degradation (telecommunications) , solid oxide fuel cell , thermal , tec , electrode , chemistry , thermodynamics , electrical engineering , mathematics , subduction , tectonics , biology , paleontology , ionosphere , mathematics education , astronomy , engineering , physics
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