Influence of Cathodic Potential on Structural and Optical Properties of ZnO;Mg Thin Film | Zendy

Hiroki Ishizaki | Zendy; Seishiro Ito | Zendy

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Influence of Cathodic Potential on Structural and Optical Properties of ZnO;Mg Thin Film

Author(s) -

Hiroki Ishizaki,

Seishiro Ito

Publication year - 2012

Publication title -

ecs transactions

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.235

H-Index - 52

eISSN - 1938-6737

pISSN - 1938-5862

DOI - 10.1149/1.3701536

Subject(s) - cathodic protection , wurtzite crystal structure , thin film , zinc , materials science , band gap , electrochemistry , magnesium , inorganic chemistry , analytical chemistry (journal) , chemistry , metallurgy , nanotechnology , optoelectronics , electrode , chromatography

ZnO:Mg thin films were prepared on conductive substrates at cathodic potential of -0.8V and -0.975V from a magnesium nitrate aqueous solution containing zinc sulfite kept at 323K by electrochemical deposition techniques. These ZnO:Mg films had wurtzite structure, regardless of cathodic potential. With a decrease in cathodic potential, Mg/(Zn+Mg) atomic ratio of these thin films and optical band gap energy decreased. In particular, ZnO:Mg thin films obtained at cathodic potential of -0.9V had Mg/(Zn+Mg) atomic ratio of 0.077 and optical band gap energy of 3.79eV. Thus, optical properties and Mg/(Zn+Mg) atomic ratio of ZnO:Mg thin films were controlled by cathodic potential.

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