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The Oxygen Permeation Properties of Nanocrystalline CeO[sub 2] Thin Films
Author(s) -
Kyle S. Brinkman,
Hitoshi Takamura,
Harry L. Tuller,
Takashi Iijima
Publication year - 2010
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.3503519
Subject(s) - nanocrystalline material , materials science , oxygen , partial pressure , grain size , cerium oxide , chemical engineering , thin film , sintering , permeation , oxygen permeability , membrane , ionic bonding , oxide , analytical chemistry (journal) , nanotechnology , composite material , metallurgy , chemistry , ion , chromatography , biochemistry , organic chemistry , engineering
The measurement of oxygen flux across nanocrystalline CeO{sub 2} cerium oxide thin films at intermediate temperature (650 to 800 C) is presented. Porous ceria support substrates were fabricated by sintering with carbon additions. The final dense film was deposited from an optimized sol-gel solution resulting in a mean grain size of 50 nm which displayed oxygen flux values of up to 0.014 {micro}mol/cm{sup 2}s over the oxygen partial pressure range from air to helium gas used in the measurement at 800 C. The oxygen flux characteristics confirm mixed ionic and electronic conductivity in nanocrystalline ceria films and demonstrate the role of size dependent materials properties as a design parameter in functional membranes for oxygen separation.

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