Open AccessGe[sub 2]Sb[sub 2]Te[sub 5] Charge Trapping Nanoislands with High-k Blocking Oxides for Charge Trap Memory
Author(s) -
Taeyong Eom,
Byung Joon Choi,
Seol Choi,
Tae Joo Park,
Jeong Hwan Kim,
Minah Seo,
Sang Ho Rha,
Cheol Seong Hwang
Publication year - 2009
Publication title -
electrochemical and solid-state letters
Language(s) - English
Resource type - Journals
eISSN - 1944-8775
pISSN - 1099-0062
DOI - 10.1149/1.3195078
Subject(s) - materials science , trapping , charge (physics) , quantum tunnelling , capacitor , capacitance , trap (plumbing) , analytical chemistry (journal) , voltage , chemical vapor deposition , optoelectronics , deposition (geology) , nanotechnology , electrode , electrical engineering , chemistry , physics , ecology , paleontology , quantum mechanics , chromatography , sediment , meteorology , biology , engineering
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