Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes | Zendy

G. J. la O’ | Zendy; Y. Shao-Horn | Zendy

Open Access

Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes

Author(s) -

G. J. la O’,

Y. Shao-Horn

Publication year - 2009

Publication title -

electrochemical and solid-state letters

Language(s) - English

Resource type - Journals

eISSN - 1944-8775

pISSN - 1099-0062

DOI - 10.1149/1.3095681

Subject(s) - lanthanum , strontium , materials science , oxygen reduction reaction , manganese , perovskite (structure) , microelectrode , kinetics , thin film , inorganic chemistry , chemical engineering , electrode , nanotechnology , electrochemistry , chemistry , metallurgy , organic chemistry , physics , quantum mechanics , engineering

Oxygen reduction reaction (ORR) kinetics was investigated on dense La₀.₈Sr₀.₂MnO₃ microelectrodes as a function of temperature and microelectrode thickness using electrochemical impedance spectroscopy. The surface oxygen exchange and mixed bulk/three-phase-boundary (TPB) charge transfer process were found to control ORR kinetics at high and low temperatures, respectively. The transition temperature from the mixed bulk/TPB charge transfer control to surface oxygen exchange was found to be highly dependent on the microelectrode thickness (~600degrees C for 65 nm vs ~800degreesC for 705 nm). These findings can be used to guide the design of electrodes that can operate at intermediate temperatures.National Science Foundation (U.S.) (Materials Research Science and Engineering Center (MRSEC) Program, Award DMR-0819762)National Science Foundation (U.S.) (NSF grant no. CBET-0844526

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