TEM Investigation of the Role of a Nano-oxide Layer in Aluminum-Induced Crystallization of a-Si:H
Author(s) -
Marwan Albarghouti,
Hameed A. Naseem,
Mowafak AlJassim
Publication year - 2006
Publication title -
electrochemical and solid-state letters
Language(s) - English
Resource type - Journals
eISSN - 1944-8775
pISSN - 1099-0062
DOI - 10.1149/1.2197150
Subject(s) - materials science , crystallization , annealing (glass) , transmission electron microscopy , amorphous solid , silicon , aluminium , layer (electronics) , chemical engineering , amorphous silicon , diffraction , composite material , nanotechnology , crystallography , metallurgy , optics , crystalline silicon , chemistry , physics , engineering
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