Degradation of Sodium β″‐Alumina: Effect of Microstructure
Author(s) -
Andrew C. Buechele,
Lutgard C. De Jonghe,
David C. Hitchcock
Publication year - 1983
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.2119881
Subject(s) - equivalence (formal languages) , electrolyte , microstructure , weibull distribution , weibull modulus , materials science , failure mode and effects analysis , reliability (semiconductor) , degradation (telecommunications) , statistics , electrode , mathematics , metallurgy , thermodynamics , composite material , chemistry , physics , electronic engineering , engineering , power (physics) , discrete mathematics
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