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Passivation of Surfaces within Aluminum Etch Tunnels
Author(s) -
Bruce J. Wiersma,
Yongsug Tak,
Kurt R. Hebert
Publication year - 1991
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.2085592
Subject(s) - passivation , dissolution , overpotential , materials science , cathodic protection , aluminium , current (fluid) , anode , etching (microfabrication) , metallurgy , electrode , composite material , chemistry , electrical engineering , electrochemistry , layer (electronics) , engineering
Transient events accompanying passivation of active surfaces in aluminum etch tunnels are investigated. Passivation is induced by pulsed reductions of the anodic etching current, of several milliseconds duration. Scanning electron microscopy is used to measure the area passivated. Potential transients are analyzed to identify a possible potential driving force for passivation

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