Analysis of Products at Reaction Sites by Fluorescence Microspectroscopy Using the f-NSOM Technique
Author(s) -
Woojin Lee,
Francis Guillaume,
Trevor L. Knutson,
William H. Smyrl
Publication year - 2005
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.1859816
Subject(s) - analytical chemistry (journal) , near field scanning optical microscope , fluorescence , optical microscope , chemistry , ion , electrochemistry , spectroscopy , precipitation , materials science , scanning electron microscope , electrode , optics , chromatography , physics , organic chemistry , quantum mechanics , meteorology , composite material
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