Open AccessCharacterization of AA2024‐T3 by Scanning Kelvin Probe Force Microscopy
Author(s) -
Patrik Schmutz,
G. S. Frankel
Publication year - 1998
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.1838633
Subject(s) - intermetallic , kelvin probe force microscope , noble metal , matrix (chemical analysis) , materials science , characterization (materials science) , phase (matter) , volta potential , analytical chemistry (journal) , metal , metallurgy , chemistry , atomic force microscopy , composite material , nanotechnology , alloy , organic chemistry , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom