(Invited) Second Harmonic Generation: A Powerful Non-Destructive Characterization Technique for Dielectric-on-Semiconductor Interfaces
Author(s) -
I. Ionica,
Dimitrios Damianos,
Anne Kaminski,
Danièle Blanc-Pélissier,
G. Ghibaudo,
S. Cristoloveanu,
Lionel Bastard,
Aude Bouchard,
Xavier Mescot,
Martine Gri,
Lei Ming,
Brian Larzelere,
G. Vitrant
Publication year - 2020
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/09701.0119ecst
Subject(s) - characterization (materials science) , wafer , semiconductor , dielectric , second harmonic generation , materials science , optoelectronics , signal (programming language) , interface (matter) , electric field , optics , electronic engineering , nanotechnology , computer science , physics , engineering , laser , capillary number , programming language , quantum mechanics , capillary action , composite material
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