Open Access(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation
Author(s) -
I. Ionica,
Dimitrios Damianos,
Anne Kaminski,
G. Vitrant,
Danièle Blanc-Pélissier,
J. Changala,
M. Kryger,
Corina Barbos,
S. Cristoloveanu
Publication year - 2016
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/07202.0139ecst
Subject(s) - materials science , dielectric , semiconductor , optoelectronics , characterization (materials science) , silicon , second harmonic generation , passivation , electric field , thin film , signal (programming language) , insulator (electricity) , laser , optics , nanotechnology , computer science , physics , layer (electronics) , quantum mechanics , programming language
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom