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(Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy
Author(s) -
Matthias H. Richter,
Michael F. Lichterman,
Shu Hu,
Ethan J. Crumlin,
Thomas Mayer,
Stephanus Axnanda,
Marco Favaro,
Walter S. Drisdell,
Z. Hussain,
Bruce S. Brunschwig,
Nathan S. Lewis,
Zhi Liu,
H. J. Lewerenz
Publication year - 2015
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/06606.0105ecst
Subject(s) - x ray photoelectron spectroscopy , synchrotron radiation , monochromatic color , materials science , ambient pressure , analytical chemistry (journal) , photoemission spectroscopy , stack (abstract data type) , spectroscopy , synchrotron , band gap , optoelectronics , chemistry , optics , physics , nuclear magnetic resonance , chromatography , quantum mechanics , computer science , thermodynamics , programming language
The energy-band relations and electronic properties for the light absorber/protection-layer stack of TiO_2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.

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