Open AccessA Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis
Author(s) -
Tianshu Hou,
Peining Zhen,
Zhigang Ji,
HaiBao Chen
Publication year - 2022
Publication title -
acm transactions on design automation of electronic systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.266
H-Index - 51
eISSN - 1557-7309
pISSN - 1084-4309
DOI - 10.1145/3567424
Subject(s) - electromigration , computer science , partial differential equation , reliability (semiconductor) , very large scale integration , scaling , algorithm , mathematical optimization , materials science , mathematics , mathematical analysis , power (physics) , physics , geometry , quantum mechanics , composite material , embedded system
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom