A View-Dependent Metric for Patch-Based LOD Generation 8 Selection
Author(s) -
Thibaud Lambert,
Pierre Bénard,
Gaël Guennebaud
Publication year - 2018
Publication title -
proceedings of the acm on computer graphics and interactive techniques
Language(s) - English
Resource type - Journals
ISSN - 2577-6193
DOI - 10.1145/3203195
Subject(s) - metric (unit) , polygon (computer graphics) , decimation , tessellation (computer graphics) , computer science , parametrization (atmospheric modeling) , selection (genetic algorithm) , enhanced data rates for gsm evolution , algorithm , orientation (vector space) , mathematical optimization , factor (programming language) , topology (electrical circuits) , mathematics , artificial intelligence , geometry , computer vision , computer graphics (images) , telecommunications , operations management , physics , frame (networking) , quantum mechanics , combinatorics , economics , programming language , radiative transfer , filter (signal processing)
With hardware tessellation, highly detailed geometric models are decomposed into patches whose tessellation factor can be specified dynamically and independently at render time to control polygon resolution. Yet, to achieve maximum efficiency, an appropriate factor needs to be selected for each patch according to its content (geometry and appearance) and the current viewpoint distance and orientation. We propose a novel patch-based error metric that addresses this problem. It summarizes both the geometrical error and the texture parametrization deviation of a simplified patch compared to the corresponding detailed surface. This metric is compact and can be efficiently evaluated on the GPU along any view direction. Furthermore, based on this metric, we devise an easy-to-implement refitting optimization that further reduces the simplification error of any decimation algorithm, and propose a new placement strategy and cost function for edge-collapses to reach the best quality/performances trade-off.
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