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Verification-Guided Soft Error Resilience
Author(s) -
Sanjit A. Seshia,
Wenchao Li,
Subhasish Mitra
Publication year - 2007
Publication title -
2007 design, automation and test in europe conference and exhibition
Language(s) - English
DOI - 10.1145/1266366.1266681
Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches

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