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Utilization of SECDED for Soft Error and Variation-Induced Defect Tolerance in Caches
Author(s) -
Luong Dinh Hung,
Hidetsugu Irie,
Masahiro Goshima,
Shuichi Sakai
Publication year - 2007
Publication title -
2007 design, automation and test in europe conference and exhibition
Language(s) - English
DOI - 10.1145/1266366.1266612
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache. This constraint is enforced through selective write-through mechanism. An error occurring in a defective block can be detected and the correct data can be obtained from the lower level caches.

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