Open AccessScan-BIST based on cluster analysis and the encoding of repeating sequences
Author(s) -
Lei Li,
Zhong Lin Wang,
Krishnendu Chakrabarty
Publication year - 2007
Publication title -
acm transactions on design automation of electronic systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.266
H-Index - 51
eISSN - 1557-7309
pISSN - 1084-4309
DOI - 10.1145/1217088.1217092
Subject(s) - computer science , pseudorandom number generator , benchmark (surveying) , built in self test , parallel computing , algorithm , encoding (memory) , automatic test pattern generation , chip , computer hardware , electronic circuit , embedded system , artificial intelligence , telecommunications , geography , electrical engineering , geodesy , engineering
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