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Scaling of very large scale integration (VLSI) technologies, coupled with increased integrated circuit complexity, will strongly increase the occurrence of transient faults (also known as soft errors) [1]. Transient faults, unlike manufacturing or design faults, do not occur consistently. Instead, these faults are caused by external events, such as electromagnetic interferences, power glitches, or highly energized particles striking the chip. These events do not cause permanent physical damage to the chip, but can alter signal transfers or stored values and thus cause incorrect program execution [2].

A low-cost correction algorithm for transient data errors