UHV-TEM-REM Studies of Si(111) Surfaces
Author(s) -
K. Yagi,
Atsushi Yamanaka,
Hiroaki Sato,
M. Shima,
Hironori Ohse,
S. Ozawa,
Y. Tanishiro
Publication year - 2013
Publication title -
progress of theoretical physics supplement
Language(s) - Uncategorized
Resource type - Journals
ISSN - 0375-9687
DOI - 10.1143/ptp.106.303
Subject(s) - transmission electron microscopy , reflection high energy electron diffraction , scattering , materials science , anisotropy , condensed matter physics , reflection (computer programming) , electron diffraction , phase transition , scanning transmission electron microscopy , crystallography , molecular physics , chemistry , diffraction , optics , nanotechnology , physics , computer science , programming language
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