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RHEED Intensity from Vicinal Si(100) Surfaces
Author(s) -
T. Kawamura
Publication year - 2013
Publication title -
progress of theoretical physics supplement
Language(s) - Uncategorized
Resource type - Journals
ISSN - 0375-9687
DOI - 10.1143/ptp.106.295
Subject(s) - vicinal , reflection high energy electron diffraction , specular reflection , intensity (physics) , molecular beam epitaxy , scattering , oscillation (cell signaling) , chemistry , optics , molecular physics , condensed matter physics , crystallography , epitaxy , electron diffraction , physics , diffraction , biochemistry , organic chemistry , layer (electronics)

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