Near-Field Optics Imaging in Silica Waveguide Using Near-Field Scanning Optical Microscope
Author(s) -
YuanFong Chou Chau,
Din Ping Tsai
Publication year - 2007
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.1143/jjap.46.238
Subject(s) - near field scanning optical microscope , optical microscope , materials science , dielectric , spheres , near field optics , waveguide , optics , near and far field , field (mathematics) , microscopy , electric field , nanoparticle , optoelectronics , nanotechnology , scanning electron microscope , physics , composite material , mathematics , pure mathematics , quantum mechanics , astronomy
We investigated the near-field optics imaging by a numerical method using special spherical chains created in a silica waveguide (SWG) and explored the possibility of how this can be used for near-field scanning optical microscopy (NSOM) applications. There are two types of spherical nanochain; type A includes nano-dielectric spheres connected closely, and type B includes silver nanoparticles 4 nm in diameter randomly distributed inside the nanospheres of type A. A spherical nanochain with the 80-nm-diameter spheres was embedded in the SWG. The interactions between light emerging from SWG and the electric field near the sample surface that affects the properties of the images produced by NSOM are analyzed using a three dimensional finite-difference time-domain method. The effects of the optical field distribution generated by some factors are also discussed. A method of controlling the light field localized in the SWG is proposed that uses the external protrusion (dielectric sphere). The proposed structure will yield some useful information and give an idea of applications in NSOM.
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