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Carrier Injection into SiO2from Si Surface Driven to Avalanche Breakdown by a Linear Ramp Pulse, and Trapping, Distribution and Thermal Annealing of Injected Holes in SiO2
Author(s) -
Kotobu Nagai,
Yutaka Hayashi,
Yasuo Tarui
Publication year - 1976
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.1143/jjap.15.409a
Subject(s) - trapping , annealing (glass) , materials science , thermal , pulse (music) , molecular physics , condensed matter physics , analytical chemistry (journal) , optics , chemistry , composite material , thermodynamics , physics , ecology , biology , chromatography , detector

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