Achieving a Low Interfacial Density of States with a Flat Distribution in High-$\kappa$ Ga$_{2}$O$_{3}$(Gd$_{2}$O$_{3}$) Directly Deposited on Ge
Author(s) -
Chunan Lin,
H. C. Lin,
Tsung-Hung Chiang,
Reilin Chu,
Lungkun Chu,
T. H. Lin,
Yaochung Chang,
Wei Wang,
J. Raynien Kwo,
M. Hong
Publication year - 2011
Publication title -
applied physics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.911
H-Index - 94
eISSN - 1882-0786
pISSN - 1882-0778
DOI - 10.1143/apex.4.111101
Subject(s) - materials science , conductance , conduction band , passivation , range (aeronautics) , band gap , condensed matter physics , enhanced data rates for gsm evolution , distribution (mathematics) , thermal conduction , density of states , charge density , analytical chemistry (journal) , dielectric , layer (electronics) , chemistry , optoelectronics , physics , nanotechnology , electron , mathematics , composite material , nuclear physics , telecommunications , mathematical analysis , quantum mechanics , chromatography , computer science
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