Open AccessThe importance of EBIT data for Z-pinch plasma diagnostics
Author(s) -
A.S. Safronova,
V. L. Kantsyrev,
P. Neill,
M. S. Safronova,
D. A. Fedin,
N. D. Ouart,
M. F. Yilmaz,
G. C. Osborne,
I. Shrestha,
K. M. Williamson,
Travis Hoppe,
C. D. Harris,
P. Beiersdörfer,
Stephanie B. Hansen
Publication year - 2008
Publication title -
canadian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.244
H-Index - 57
eISSN - 1208-6045
pISSN - 0008-4204
DOI - 10.1139/p07-170
Subject(s) - electron beam ion trap , physics , z pinch , pinch , atomic physics , spectral line , plasma , plasma diagnostics , electron , spectroscopy , ion , spectrometer , cathode ray , optics , nuclear physics , quantum mechanics , astronomy
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom