Open AccessSingle-atom vibrational spectroscopy in the scanning transmission electron microscope
Author(s) -
Fredrik S. Hage,
Guillaume Radtke,
Demie Kepaptsoglou,
Michele Lazzeri,
Quentin M. Ramasse
Publication year - 2020
Publication title -
science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 12.556
H-Index - 1186
eISSN - 1095-9203
pISSN - 0036-8075
DOI - 10.1126/science.aba1136
Subject(s) - spectroscopy , scanning transmission electron microscopy , silicon , atom (system on chip) , electron energy loss spectroscopy , atomic physics , molecular physics , resolution (logic) , materials science , scanning electron microscope , molecular vibration , impurity , energy dispersive x ray spectroscopy , scattering , energy filtered transmission electron microscopy , graphene , chemistry , transmission electron microscopy , optics , physics , optoelectronics , nanotechnology , quantum mechanics , computer science , embedded system , organic chemistry , artificial intelligence , raman spectroscopy
Seeing single silicon atom vibrations Vibrational spectroscopy can achieve high energy resolution, but spatial resolution of unperturbed vibrations is more difficult to realize. Hageet al. show that a single-atom impurity in a solid (a silicon atom in graphene) can give rise to distinctive localized vibrational signatures. They used high-resolution electron energy-loss spectroscopy in a scanning transmission electron microscope to detect this signal. An experimental geometry was chosen that reduced the relative elastic scattering contribution, and repeated scanning near the silicon impurity enhanced the signal. The experimental vibration frequencies are in agreement with ab initio calculations.Science , this issue p.1124
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