Response to Comment on “The Local Structure of Amorphous Silicon” | Zendy

M.M.J. Treacy | Zendy; Konstantin B. Borisenko | Zendy

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Response to Comment on “The Local Structure of Amorphous Silicon”

Author(s) -

M.M.J. Treacy,

Konstantin B. Borisenko

Publication year - 2012

Publication title -

science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 12.556

H-Index - 1186

eISSN - 1095-9203

pISSN - 0036-8075

DOI - 10.1126/science.1222571

Subject(s) - diffraction , nanometre , amorphous solid , amorphous silicon , silicon , resolution (logic) , materials science , amorphous silica , electron diffraction , raw data , crystallography , nanotechnology , optics , chemical physics , chemistry , physics , crystalline silicon , computer science , mathematics , optoelectronics , chemical engineering , statistics , engineering , artificial intelligence

The averaged diffraction data alone cannot distinguish between models with different heterogeneous structures at length scales of about 2 nanometers, even when using high-resolution data. Although our approach to calculating diffraction intensities from the model differs from that of Roorda and Lewis, paracrystallinity in amorphous silicon is undeniably evident in the raw experimental fluctuation electron microscopy data.

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