Interface Structure and Atomic Bonding Characteristics in Silicon Nitride Ceramics | Zendy

Alexander Ziegler | Zendy; Juan Carlos Idrobo | Zendy; Michael K. Cinibulk | Zendy; C. Kisielowski | Zendy; Nigel D. Browning | Zendy; Robert O. Ritchie | Zendy

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Interface Structure and Atomic Bonding Characteristics in Silicon Nitride Ceramics

Author(s) -

Alexander Ziegler,

Juan Carlos Idrobo,

Michael K. Cinibulk,

C. Kisielowski,

Nigel D. Browning,

Robert O. Ritchie

Publication year - 2004

Publication title -

science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 12.556

H-Index - 1186

eISSN - 1095-9203

pISSN - 0036-8075

DOI - 10.1126/science.1104173

Subject(s) - materials science , ceramic , silicon nitride , interface (matter) , silicon , nitride , atom (system on chip) , phase (matter) , metallic bonding , nanotechnology , optoelectronics , metal , metallurgy , composite material , computer science , chemistry , layer (electronics) , organic chemistry , capillary number , capillary action , embedded system

Direct atomic resolution images have been obtained that illustrate how a range of rare-earth atoms bond to the interface between the intergranular phase and the matrix grains in an advanced silicon nitride ceramic. It has been found that each rare-earth atom bonds to the interface at a different location, depending on atom size, electronic configuration, and the presence of oxygen at the interface. This is the key factor to understanding the origin of the mechanical properties in these ceramics and will enable precise tailoring in the future to critically improve the materials' performance in wide-ranging applications.

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