Open AccessX-ray Fourier ptychography
Author(s) -
Klaus Wakonig,
Ana Díaz,
Anne Bonnin,
Marco Stampai,
A. Bergamaschi,
Johannes Ihli,
Manuel GuizarSicairos,
Andreas Menzel
Publication year - 2019
Publication title -
science advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.928
H-Index - 146
ISSN - 2375-2548
DOI - 10.1126/sciadv.aav0282
Subject(s) - ptychography , optics , fourier transform , computer science , lens (geology) , phase contrast imaging , resolution (logic) , microscopy , contrast (vision) , microscope , phase (matter) , phase retrieval , phase contrast microscopy , physics , artificial intelligence , diffraction , quantum mechanics
A new image acquisition scheme increases resolution and sensitivity of x-ray microscopes.
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