Direct quantitative measurement of the C═O⋅⋅⋅H–C bond by atomic force microscopy
Author(s) -
Shigeki Kawai,
Tomohiko Nishiuchi,
Takuya Kodama,
Peter Spijker,
Rémy Pawlak,
Tobias Meier,
John Tracey,
Takashi Kubo,
Ernst Meyer,
Adam S. Foster
Publication year - 2017
Publication title -
science advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.928
H-Index - 146
ISSN - 2375-2548
DOI - 10.1126/sciadv.1603258
Subject(s) - atomic force microscopy , hydrogen bond , molecule , kelvin probe force microscope , microscopy , materials science , hydrogen , photoconductive atomic force microscopy , nanotechnology , chemical physics , chemistry , crystallography , analytical chemistry (journal) , physics , scanning capacitance microscopy , optics , scanning confocal electron microscopy , chromatography , organic chemistry
The hydrogen atom-the smallest and most abundant atom-is of utmost importance in physics and chemistry. Although many analysis methods have been applied to its study, direct observation of hydrogen atoms in a single molecule remains largely unexplored. We use atomic force microscopy (AFM) to resolve the outermost hydrogen atoms of propellane molecules via very weak C=O center dot center dot center dot H-C hydrogen bonding just before the onset of Pauli repulsion. The direct measurement of the interaction with a hydrogen atom paves the way for the identification of three-dimensional molecules such as DNAs and polymers, building the capabilities of AFMtoward quantitative probing of local chemical reactivity.Peer reviewe
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