Nanoscale chemical imaging by photoinduced force microscopy
Author(s) -
Derek Nowak,
William Morrison,
H. K. Wickramasinghe,
Junghoon Jahng,
Eric O. Potma,
Lei Wan,
Ricardo Ruiz,
T. R. Albrecht,
Kristin Schmidt,
Jane Frommer,
Daniel P. Sanders,
Sung Park
Publication year - 2016
Publication title -
science advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.928
H-Index - 146
ISSN - 2375-2548
DOI - 10.1126/sciadv.1501571
Subject(s) - chemical imaging , nanoscopic scale , nanotechnology , materials science , nanomaterials , nanostructure , infrared , chemical species , polarizability , microscopy , hyperspectral imaging , optics , chemistry , computer science , molecule , physics , organic chemistry , artificial intelligence
Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.
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